Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-27T01:40:36.554Z Has data issue: false hasContentIssue false
  • English
  • Français

Helium Ion Microscopy, Principles and Applications, David C. Joy. Springer, New York, 2013, 64 pages. ISBN 978-1-4614-8659-6.

Published online by Cambridge University Press:  24 February 2014

Michael T. Postek
Michael T. Postek*
Affiliation:
Semiconductor and Dimensional Metrology DivisionPhysical Measurement LaboratoryNational Institute of Standards and TechnologyGaithersburg, MD
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Book Review
Information
Microscopy and Microanalysis , Volume 20 , Issue 2 , April 2014 , pp. 645
Copyright
© Microscopy Society of America 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)