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Application of Dynamic Impedance Spectroscopy to Scanning Probe Microscopy

Published online by Cambridge University Press:  13 February 2014

Mateusz Tomasz Tobiszewski ,
Anna Arutunow  and
Kazimierz Darowicki
Mateusz Tomasz Tobiszewski*
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk, Poland
Anna Arutunow
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk, Poland
Kazimierz Darowicki
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk, Poland
*
*Corresponding author. mateusztobiszewski@gmail.com
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Abstract

Dynamic impedance spectroscopy, designed for measuring nonstationary systems, was used in combination with scanning probe microscopy. Using this approach, impedance mapping could be carried-out simultaneously with topography scanning. Therefore, correlation of electrical properties with particular phases of an examined sample was possible. The sample used in this study was spheroidal graphite cast iron with clearly defined phases having significantly different properties. Additionally, impedance-force curves were made at graphite precipitation and ferrite matrix to illustrate the relation between impedance and the force applied to a probe.

Keywords

AFMSPMDEISnanoimpedanceimpedancenanocontact
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 20 , Issue 2 , April 2014 , pp. 582 - 585
Copyright
© Microscopy Society of America 2014 

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