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Visualizing and Correcting Dynamic Specimen Processes in TEM Using a Direct Detection Device

Published online by Cambridge University Press:  09 October 2013

B.E. Bammes
Affiliation:
D.-H. Chen
Affiliation:
L. Jin
Affiliation:
R.B. Bilhorn
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013