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Investigations on electrical conduction properties and crystallization conditions of V2O5-P2O5 glass based semiconductors

Published online by Cambridge University Press:  18 February 2013

Akifumi Matsuda
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259-J3-16 Nagatsuta, Midori, Yokohama 226-8502, Japan.
Takuya Aoyagi
Affiliation:
Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Omika, Hitachi 319-1292, Japan.
Takashi Naito
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259-J3-16 Nagatsuta, Midori, Yokohama 226-8502, Japan. Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Omika, Hitachi 319-1292, Japan.
Tadashi Fujieda
Affiliation:
Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Omika, Hitachi 319-1292, Japan.
Kenjiro Ikejiri
Affiliation:
Namiki Precision Jewel Co., Ltd., 3-8-22 Shinden, Adachi, Tokyo 123-8511, Japan.
Koji Koyama
Affiliation:
Namiki Precision Jewel Co., Ltd., 3-8-22 Shinden, Adachi, Tokyo 123-8511, Japan.
Ryosuke Yamauchi
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259-J3-16 Nagatsuta, Midori, Yokohama 226-8502, Japan.
Geng Tan
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259-J3-16 Nagatsuta, Midori, Yokohama 226-8502, Japan.
Satoru Kaneko
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259-J3-16 Nagatsuta, Midori, Yokohama 226-8502, Japan. Kanagawa Industrial Technology Center, 705-1 Shimoimaizumi, Ebina 243-0435, Japan.
Mamoru Yoshimoto
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259-J3-16 Nagatsuta, Midori, Yokohama 226-8502, Japan.
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Abstract

We studied the electrical properties of thermally treated V2O5-CuO-Fe2O3-P2O5 (vanadate) glasses under reducing high-vacuum conditions. The glasses were prepared by using a melt-quenching method and then applied on Al2O3 substrates as ∼40μm-thick films. The glass films were then heat treated at 375−550°C under a vacuum of 10−6 Pa. Powder X-ray diffraction showed the formation of complex oxides of both MxV2O5 (M = Cu, Fe; x = 0.12−1.3) and vanadium oxides (VOx; x = 1.5−2.5). The resistivity of the glass film crystallized at 550°C measured at 50°C and 300°C were 1.8 × 100 Ωcm and 2.8 × 10−1 Ωcm, respectively, which was 10 times lower than that of the film crystallized in air. The Seebeck coefficient was −132 μV/K at 50°C and −130 μV/K at 300°C. These results show that the vanadate glasses crystallized under the appropriate condition become potential candidate materials for semiconductor and thermoelectric application.

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

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References

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