Hostname: page-component-7c8c6479df-nwzlb Total loading time: 0 Render date: 2024-03-29T13:59:58.476Z Has data issue: false hasContentIssue false

Absorption enhancement by Ni-silicide nanostructures embedded in ultra-thin Si films

Published online by Cambridge University Press:  23 November 2012

R. Sachan
Affiliation:
Material Science and Engineering, University of Tennessee-Knoxville, Knoxville, TN
C. Gonzalez
Affiliation:
Material Science and Engineering, University of Tennessee-Knoxville, Knoxville, TN
O. Dyck
Affiliation:
Material Science and Engineering, University of Tennessee-Knoxville, Knoxville, TN
P. Rack
Affiliation:
Material Science and Engineering, University of Tennessee-Knoxville, Knoxville, TN
G. Duscher
Affiliation:
Material Science and Engineering, University of Tennessee-Knoxville, Knoxville, TN
R. Kalyanaraman
Affiliation:
Material Science and Engineering, University of Tennessee-Knoxville, Knoxville, TN
H. Garcia
Affiliation:
Southern Illinois University, Edwardsville, IL
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)