Microscopy and Microanalysis

Special Section: Aberration-Corrected Electron Microscopy

Environmental Transmission Electron Microscopy in an Aberration-Corrected Environment

Thomas W. Hansena1 c1 and Jakob B. Wagnera1

a1 Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark


The increasing use of environmental transmission electron microscopy (ETEM) in materials science provides exciting new possibilities for investigating chemical reactions and understanding both the interaction of fast electrons with gas molecules and the effect of the presence of gas on high-resolution imaging. A gaseous atmosphere in the pole-piece gap of the objective lens of the microscope alters both the incoming electron wave prior to interaction with the sample and the outgoing wave below the sample. Whereas conventional TEM samples are usually thin (below 100 nm), the gas in the environmental cell fills the entire gap between the pole pieces and is thus not spatially localized. By using an FEI Titan environmental transmission electron microscope equipped with a monochromator and an aberration corrector on the objective lens, we have investigated the effects on imaging and spectroscopy caused by the presence of the gas.

(Received October 31 2011)

(Accepted February 21 2012)


c1 Corresponding author. E-mail: twh@cen.dtu.dk