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Scanning probe microscopy of solar cells: From inorganic thin films to organic photovoltaics

Published online by Cambridge University Press:  12 July 2012

James R. O’Dea ,
Louisa M. Brown ,
Nikolas Hoepker ,
John A. Marohn  and
Sascha Sadewasser
James R. O’Dea
Affiliation:
Cornell University; jro66@cornell.edu
Louisa M. Brown
Affiliation:
Cornell University; lmb327@cornell.edu
Nikolas Hoepker
Affiliation:
Cornell University; nch28@cornell.edu
John A. Marohn
Affiliation:
Cornell University; jam99@cornell.edu
Sascha Sadewasser
Affiliation:
International Iberian Nanotechnology Laboratory, Braga, Portugal; sascha.sadewasser@inl.int
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Abstract

Scanning probe microscopy (SPM) has made significant contributions to our understanding of the sub-processes underlying photovoltaic action. These techniques allow local investigation of the electrical and optical properties of a material. Spatially resolved measurements of surface photovoltage and photocurrent have been particularly useful in understanding charge generation and separation. In thin-film inorganic solar cells, for example, Kelvin probe force microscopy (KPFM) has revealed that charge separation does not occur at a heterojunction as expected, but instead occurs at a homojunction buried ∼50 nm within the absorbing layer. In organic photovoltaics, submicron maps of photocurrent have contributed to the understanding of the interplay between processing conditions, blend morphology, and device performance. Such functional imaging distinguishes SPM from complementary structural characterization techniques. Our goal in this article is to provide the materials science community with an appreciation for the capabilities, considerations, and limitations associated with SPM studies of solar cell materials and devices. Highlighted techniques include scanning tunneling microscopy, photoconductive atomic force microscopy, near-field scanning optical microscopy, KPFM, and time-resolved electric force microscopy.

Keywords

Scanning probe microscopy (SPM)photovoltaicorganicthin filmelectronic material
Type
Research Article
Information
MRS Bulletin , Volume 37 , Issue 7: Scanning probes for new energy materials: Probing local structure and function , July 2012 , pp. 642 - 650
Copyright
Copyright © Materials Research Society 2012

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