Powder Diffraction

Table of Contents - June 2004 - Volume 19, Issue 02  

Special Section on Microanalysis

Microdiffraction using two-dimensional detectors

Bob Baoping Hea1 c1

a1 Bruker AXS Inc., 5465 East Cheryl Parkway Madison, Wisconsin 53711

Abstract

X-ray diffraction analysis on small samples or micro-area of large samples is always a challenge due to weak diffraction and poor statistics, especially when dealing with samples containing large grain size, inhomogeneous phase distribution, and preferred orientation. Two-dimensional X-ray diffraction has many advantages in microdiffraction analysis. A two-dimensional detector can collect a large amount of data both in terms of speed and angular coverage. This paper covers some aspects about instrumentation of two-dimensional X-ray diffraction and its applications in phase identification and stress analysis on small samples and micro-area of large samples.

(Received March 15 2004)

(Accepted March 30 2004)

Correspondence:

c1 Author to whom correspondence should be addressed; Electronic mail: bhe@bruker-axs.com