Powder Diffraction

New Diffraction Data

X-ray powder diffraction study of ZnGa2Te4

Rashmia1 c1 and U. Dhawana1 c1

a1 X-ray Analysis, Materials Characterization Division, National Physical Laboratory Dr. K. S. Krishnan Marg, New Delhi 110 012, India

Abstract

ZnGa2Te4 was found to crystallize in a defect tetrahedral structure with possible space group I4(82) with Z=2. Complete X-ray powder diffraction data were obtained and the unit cell parameters a and c and X-ray density were calculated. These were a=0.5930(1) nm, c=1.1859(3) nm, and Dx=5.7×103 kg/m3.

(Received May 10 2001)

(Accepted October 12 2001)

Key words

  • chalcogenides, ZnGa2Te4;
  • defect tetrahedral structure;
  • X-ray diffraction;
  • crystal structure;
  • powder diffraction data

Correspondence:

c1 Electronic mail: rashmi@csnpl.ren.nic.in

c2 Retired scientist, National Physical Laboratory, New Delhi.