Powder Diffraction

Table of Contents - December 2005 - Volume 20, Issue 04  

Invited Articles

Correlation between subgrains and coherently scattering domains

T. Ungára1 c1, G. Tichya2, J. Gubiczaa2 and R. J. Hellmiga3

a1 Department of General Physics, Eötvös University, Pázmány Péter sétány 1A, Budapest H-1518 POB 32, Hungary

a2 Department of Solid State Physics, Eötvös University, Pázmány Péter sétány 1A, Budapest H-1518 POB 32, Hungary

a3 Institut für Werkstoffkunde und Werkstofftechnik, TU Clausthal, Agricolastr, 6, 38678 Clausthal-Zellerfeld, Germany

Abstract

Crystallite size determined by X-ray line profile analysis is often smaller than the grain or subgrain size obtained by transmission electron microscopy, especially when the material has been produced by plastic deformation. It is shown that besides differences in orientation between grains or subgrains, dipolar dislocation walls without differences in orientation also break down coherency of X-rays scattering. This means that the coherently scattering domain size provided by X-ray line profile analysis provides subgrain or cell size bounded by dislocation boundaries or dipolar walls.

(Received July 08 2005)

(Accepted October 12 2005)

Key words

  • X-ray line profile analysis;
  • transmission electron microscopy (TEM);
  • crystallite size;
  • subgrains;
  • dipolar dislocation walls

Correspondence:

c1 Electronic mail: ungar@ludens.elte.hu