Powder Diffraction

Crystallography Education

Rietveld texture analysis from TOF neutron diffraction data

H.-R. Wenka1 c1, L. Lutterottia2 and S. C. Vogela3

a1 University of California, Berkeley, California 94720

a2 University of Trento, Trento, Italy 38123

a3 Lujan Center, LANSCE, Los Alamos National Laboratory, Los Alamos, New Mexico 87545


One of the advantages of a multidetector neutron time-of-flight diffractometer such as the high pressure preferred orientation diffractometer (HIPPO) at the Los Alamos Neutron Science Center is the capability to measure efficiently preferred orientation of bulk materials. A routine experimental method for measurements, both at ambient conditions, as well as high or low temperatures, has been established. However, only recently has the complex data analysis been streamlined to make it straightforward for a noninitiated user. Here, we describe the Rietveld texture analysis of HIPPO data with the computer code Materials Analysis Using Diffraction (MAUD) as a step-by-step procedure and illustrate it with a metamorphic quartz rock. Postprocessing of the results is described and neutron diffraction results are compared with electron backscatter diffraction measurements on the same sample.

(Received February 24 2010)

(Accepted June 03 2010)

Key Words:

  • texture analysis;
  • neutron diffraction;
  • Rietveld method;
  • quartzite


c1 Author to whom correspondence should be addressed. Electronic mail: wenk@berkeley.edu