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MEMS-Based Electrical Testing of IBID Carbon and Tungsten Wires

Published online by Cambridge University Press:  08 April 2017

A Ng ,
L Germinario ,
A Borisevich ,
S Pennycook ,
S Rosenthal  and
D Leonard
A Ng
Affiliation:
Vanderbilt University
L Germinario
Affiliation:
Appalachian State University
A Borisevich
Affiliation:
Oak Ridge National Laboratory
S Pennycook
Affiliation:
Oak Ridge National Laboratory
S Rosenthal
Affiliation:
Vanderbilt University
D Leonard
Affiliation:
Oak Ridge National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 436 - 437
Copyright
Copyright © Microscopy Society of America 2011