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Simple method for characterizing linear multi-port microstrip structures

Published online by Cambridge University Press:  19 April 2011

Julio A. Lonac ,
Ilan Melczarsky  and
Rudi P. Paganelli
Julio A. Lonac
Affiliation:
MEC srl – Viale Pepoli, 3/2 40123 Bologna, BO, Italy.
Ilan Melczarsky
Affiliation:
DEIS, University of Bologna – Viale Risorgimento, 2 40136 Bologna, BO, Italy.
Rudi P. Paganelli*
Affiliation:
CNR-IEIIT – Viale Risorgimento, 2 40136 Bologna, BO, Italy. Phone:  + 39 051 2093845.
*
Corresponding author: R. P. Paganelli Email: rudipaolo.paganelli@cnr.it
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Abstract

A simple method for the full characterization of passive n-port microwave monolithic integrated circuit (MMIC) structures using standard two-port vector network analyzer (VNA) measurements is presented. Its main advantages are: it does not require to perform measurements from all the ports of the network, no special calibration procedure is needed, the auxiliary terminations required by the procedure can be integrated at the border of the structure under test with minimal area increase, and it can be easily implemented in commercial CAD software. The method was applied to a nine-port microstrip structure corresponding to the output power combiner and impedance matching network of an X-band MMIC high power amplifier (HPA). The full S-parameter matrix was derived from two-port measurements and compared to the circuit–as well as electromagnetic (EM)-based simulations of the structure.

Keywords

n-portmultiporton-wafer measurementsMMIC designmicrostrip structuresscattering matrix measurement
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 3 , Special Issue 3: Special Issue on European Microwave Week 2010 , June 2011 , pp. 281 - 288
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2011

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References

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