Microscopy and Microanalysis

Electron Backscatter Diffraction Special Section

A Review of Strain Analysis Using Electron Backscatter Diffraction

Stuart I. Wrighta1 c1, Matthew M. Nowella1 and David P. Fielda2

a1 EDAX-TSL, 392 East 12300 South, Draper, UT 84020, USA

a2 Washington State University, 239C Dana Hall, Pullman, WA 99164, USA

Abstract

Since the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.

(Received September 07 2010)

(Accepted January 04 2011)

(Online publication March 22 2011)

Correspondence:

c1 Corresponding author. E-mail: stuart.wright@ametek.com