Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-19T22:06:35.221Z Has data issue: false hasContentIssue false

Simulations of CVD Diamond Film Growth: 2D Models for the identities and concentrations of gas-phase species adsorbing on the surface

Published online by Cambridge University Press:  02 March 2011

Paul W. May
Affiliation:
School of Chemistry, University of Bristol, Bristol, BS8 1TS, United Kingdom.
Yuri A. Mankelevich
Affiliation:
Skobel’tsyn Institute of Nuclear Physics, Moscow State University, Leninskie gory, Moscow 119991, Russia.
Get access

Abstract

A prerequisite for modelling the growth of diamond by CVD is knowledge of the identities and concentrations of the gas-phase species which impact upon the growing diamond surface. Two methods have been devised for the estimation of this information, and have been used to determine adsorption rates for CxHy hydrocarbons for process conditions that experimentally produce single-crystal diamond, microcrystalline diamond films, nanocrystalline diamond films and ultrananocrystalline diamond films. Both methods rely on adapting a previously developed model for the gas-phase chemistry occurring in a hot filament or microwave plasma reactor. Using these methods, the concentrations of most of the CxHy radical species, with the exception of CH3, at the surface have been found to be several orders of magnitude smaller than previously believed. In most cases these low concentrations suggest that reactions such as direct insertion of C1Hy (y = 0-2) and/or C2 into surface C–H or C–C bonds can be neglected and that such species do not contribute significantly to the diamond growth process in the reactors under study.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. May, P. W., Science 319, 1490 (2008).Google Scholar
2. May, P. W., Philos. Trans. R. Soc. Lond. Ser. A 358, 473 (2000).Google Scholar
3. Netto, A. and Frenklach, M., Diamond Relat. Maters., 14, (2005) 1630.Google Scholar
4. May, P. W., Allan, N. L., Richley, J. C., Ashfold, M. N. R., Mankelevich, Yu. A., J. Phys. Cond. Matter 21, 364203 (2009).Google Scholar
5. May, P. W., Harvey, J. N., Allan, N. L., Richley, J. C., Mankelevich, Yu. A., J. Appl. Phys., 108, 014905 (2010).Google Scholar
6. May, P. W., Harvey, J. N., Allan, N. L., Richley, J. C., Mankelevich, Yu. A., J. Appl. Phys., 108, 114909 (2010).Google Scholar
7. Butler, J.E., Mankelevich, Y.A., Cheesman, A., Ma, J., Ashfold, M.N.R., J. Phys.: Cond. Matter 21, 364201 (2009).Google Scholar
8. May, P. W., Mankelevich, Yu. A., J. Phys. Chem. C 112, 12432 (2008).10.1021/jp803735aGoogle Scholar
9. Terekhov, A. D., Frolova, E. N., J. Appl. Mech. Tech. Phys., 13, 582 (1972).10.1007/BF00850407Google Scholar
10. Eckert, M., Neyts, E. and Bogaerts, A., Cryst. Eng. Comm. 11, 1597 (2009).10.1039/b822973mGoogle Scholar
11. Eckert, M., Neyts, E. and Bogaerts, A., Cryst. Growth Des. 10, 3005 (2010).Google Scholar