Journal of Materials Research


Orientation of rapid thermally annealed lead zirconate titanate thin films on (111) Pt substrates

Keith G. Brooksa1, Ian M. Reaneya1, Radosveta Klissurskaa1, Y. Huanga1, L. Bursilla1a) and N. Settera1

a1 Département de Materiaux, Laboratoire de Céramique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, CH-1015, Switzerland


The nucleation, growth, and orientation of lead zirconate titanate thin films prepared from organometallic precursor solutions by spin coating on (111) oriented platinum substrates and crystallized by rapid thermal annealing was investigated. The effects of pyrolysis temperature, post-pyrolysis thermal treatments, and excess lead addition are reported. The use of post-pyrolysis oxygen anneals at temperatures in the regime of 350–450 °C was found to strongly affect the kinetics of subsequent amorphous-pyrochlore-perovskite crystallization by rapid thermal annealing. The use of such post-pyrolysis anneals allowed films of reproducible microstructure and textures [both (100) and (111)] to be prepared by rapid thermal annealing. It is proposed that such anneals and pyrolysis temperature affect the oxygen concentration/average Pb valence in the amorphous films prior to annealing. Such changes in the Pb valence state then affect the stability of the transient pyrochlore phase and thus the kinetics of perovskite crystallization.

(Received December 08 1993)

(Accepted June 21 1994)


a) On leave from School of Physics, The University of Melbourne, Parkville, 3052, Victoria, Australia.