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Atomic-Scale Segregation and Fluctuations in Chemical Ordering FePt Thin Films

Published online by Cambridge University Press:  26 February 2011

Karen L Torres ,
Chandan Srivastava ,
Richard L Martens  and
Gregory B Thompson
Karen L Torres
Affiliation:
karenleetorres@gmail.com, The University of Alabama, Department of Metallurgical and Materials Engineering, PO Box 870202, Tuscaloosa, AL, 35487-0202, United States
Chandan Srivastava
Affiliation:
sriva001@ua.edu, The University of Alabama, Department of Metallurgical and Materials Engineering, PO Box 870202, Tuscaloosa, AL, 35487-0202, United States
Richard L Martens
Affiliation:
rmartens@mint.ua.edu, The University of Alabama, The Central Analytical Facility, PO Box 870164, Tuscaloosa, AL, 35487-0164, United States
Gregory B Thompson
Affiliation:
gthompson@eng.ua.edu, The University of Alabama, Department of Metallurgical and Materials Engineering, PO Box 870202, Tuscaloosa, AL, 35487-0202, United States
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Abstract

A series of atom probe and transmission electron microscopy (TEM) studies have been performed to quantify minute compositional fluctuations in Fe55Pt45 thin films during the A1 to L10 phase transformation. The atom probe specimens were analyzed in an Imago Local Electrode Atom Probe (LEAP®) at a target evaporation of 0.5%, a pulse fraction of 20% and a temperature of 120K. We noted a propensity of fracture failures in the LEAP with this material at lower temperatures. The atom probe reconstruction showed small levels of Pt segregation at grain boundaries in the as-deposited films. Fresnel-contrast TEM imaging confirmed high density fluctuations in these boundaries. Upon annealing at 600°C for 10 minutes, the film transformed from A1 to L10 and the grain boundaries become Fe enriched as compared to the as-deposited film.

Keywords

thin filmphase transformationgrain boundaries
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1032: Symposium I – Nanoscale Magnetic Materials and Applications , 2007 , 1032-I14-16
Copyright
Copyright © Materials Research Society 2008

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References

1. Zhang, B and Soffa, W.A., Scripta Metallurgica 30 (6), 683 (1994).10.1016/0956-716X(94)90182-1Google Scholar
2. Toney, M.F., Lee, W, Hedstrom, J.A. and Kellock, A, Journal of Applied Physics 93 (12), 9902 (2003).10.1063/1.1577226Google Scholar
3. Takahashi, Y.K. and Hono, K, Scripta Materialia 53, 403 (2005).10.1016/j.scriptamat.2005.04.037Google Scholar
4. Thompson, K, Lawrence, D, Larson, D.J., Olson, J.D., Kelly, T.F and Gorman, B, Ultramicroscopy 107, 131 (2007).10.1016/j.ultramic.2006.06.008Google Scholar
5. Williams, D.B. and Carter, C.B., Transmission Electron Microscopy, (Springer, New York, 1996) p.527 10.1007/978-1-4757-2519-3Google Scholar
6. Yang, B., Asta, M, Mryasov, O.N., Klemmer, T.J. and Chantrell, R.W., Scripta Materialia 53, 417 (2005).Google Scholar
7. Chepulskii, R.V. and Butler, W.H., Physical Review B 72, 134205 (2005).Google Scholar
8. Srivastava, C, Balasubramanian, J, Thompson, G, Turner, C, Wiest, J and Bagaria, H, in press, Journal of Applied Physics, (2007).Google Scholar