Laser and Particle Beams

ULIA-2 Special Issue

XUV interferometry using high-order harmonics: Application to plasma diagnostics

J.-F.  HERGOTT a1c1, P.  SALIÈRES a1, H.  MERDJI a1, L.  LE DÉROFF a1, B.  CARRÉ a1, T.  AUGUSTE a1, P.  MONOT a1, P.  D'OLIVEIRA a1, D.  DESCAMPS a2, J.  NORIN a2, C.  LYNG[Angstrom capital A, ring] a2, A.  L'HUILLIER a2, C.-G.  WAHLSTRÖM a2, M.  BELLINI a3 and S.  HULLER a4
a1 Service des Photons, Atomes et Molécules, CEA-DSM-DRECAM, Centre de Saclay, 91191 Gif-sur-Yvette, France
a2 Department of Physics, Lund Institute of Technology, P.O. Box 118, S-221 00 Lund, Sweden
a3 L.E.N.S., Largo E. Fermi, 2, I-50125 Florence, Italy
a4 Centre de Physique Théorique, CNRS, Ecole Polytechnique, 91128 Palaiseau, France


In this paper, we present and compare the two different XUV interferometric techniques using high-order harmonics that have been developed so far. The first scheme is based on the interference between two spatially separated phase-locked harmonic sources while the second uses two temporally separated harmonic sources. These techniques have been applied to plasma diagnostics in feasibility experiments where electron densities up to a few 1020 e/cm3 have been measured with a temporal resolution of 200 fs. We present the main characteristics of each technique and discuss their respective potentials and limitations.

(Received December 1 2000)
(Accepted February 5 2001)

c1 Address correspondence and reprint requests to: J.-F. Hergott, Service des Photons, Atomes et Molécules, Bât. 524, CEA-DSM-DRECAM, Centre de Saclay, 91191 Gif-sur-Yvette, France. E-mail: