XUV interferometry using high-order harmonics: Application to plasma diagnostics
In this paper, we present and compare the two different XUV interferometric techniques using high-order harmonics that have been developed so far. The first scheme is based on the interference between two spatially separated phase-locked harmonic sources while the second uses two temporally separated harmonic sources. These techniques have been applied to plasma diagnostics in feasibility experiments where electron densities up to a few 1020 e−/cm3 have been measured with a temporal resolution of 200 fs. We present the main characteristics of each technique and discuss their respective potentials and limitations.(Received December 1 2000)
(Accepted February 5 2001)
c1 Address correspondence and reprint requests to: J.-F. Hergott, Service des Photons, Atomes et Molécules, Bât. 524, CEA-DSM-DRECAM, Centre de Saclay, 91191 Gif-sur-Yvette, France. E-mail: firstname.lastname@example.org.