The European Physical Journal Applied Physics
- The European Physical Journal Applied Physics / Volume 10 / Issue 02 / May 2000, pp 91-96
- © EDP Sciences, 2000
- Published online by Cambridge University Press: 23 February 2011
- DOI: http://dx.doi.org/10.1051/epjap:2000125 (About DOI)
Research Article
An experimental method for measuring the Poisson's ratio in thin films and multilayers using a tensile machine set up on an X-ray goniometer
P. O. Renaulta1, K. F. Badawia1, Ph. Goudeaua1 and L. Bimbaulta1
Laboratoire de Métallurgie Physique (UMR 6630 CNRS), Université de Poitiers - SP2MI, Téléport 2, bd Marie et Pierre Curie, BP 30179, 86962 Futuroscope Chasseneuil Cedex, France
Abstract
A few years ago, some authors have observed by X-ray diffraction
analysis in metallic multilayers with small period an in plane
expansion combined with a large perpendicular expansion. These
trends differ from prediction based on simple continuum elasticity
theory. This unexpected result has been the starting point of an
experimental development in our laboratory for determining the
Poisson's ratio in such systems. Applying the
method
on film-substrate set which is elastically deformed in an X-ray
diffractometer, it is possible to extract the Poisson's ratio of
the film. In this paper, we first detail the theoretical principles
of the method and, we show its application on 150 nm thick tungsten
films elaborated by ion beam assisted deposition on duralumin
substrates. The obtained results demonstrate the feasibility of
the method and its good precision.
(Received August 25 1999)
(Revised December 9 1999)
(Accepted January 10 2000)
(Online publication May 15 2000)
PACS:
- 68.60.-p – Physical properties of thin films, nonelectronic;
- 62.20.Dc – Elasticity, elastic constants;
- 61.10.-i – X-ray diffraction and scattering
