Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-25T21:03:28.478Z Has data issue: false hasContentIssue false
  • English
  • Français

Hrem Study of Ultra Thin Titanium Films

Published online by Cambridge University Press:  10 February 2011

T. Braisaz ,
P. Ruterana ,
G. Nouet ,
Ph. Komninou ,
Th. Kehagias ,
Th. Karakostas ,
P. Poulopoulos ,
M. Aggelakeris ,
N. Flevaris  and
A. Serra
T. Braisaz
Affiliation:
Laboratoire d'Etudes et de Recherches sur les Matériaux, Unité associée CNRS 6004, Institut des Sciences de la Matière et du Rayonnement, 6 Boulevard du Maréchal Juin 14050 Caen Cedex, France, gerard@leririsl.ismra.rr
P. Ruterana
Affiliation:
Laboratoire d'Etudes et de Recherches sur les Matériaux, Unité associée CNRS 6004, Institut des Sciences de la Matière et du Rayonnement, 6 Boulevard du Maréchal Juin 14050 Caen Cedex, France, gerard@leririsl.ismra.rr
G. Nouet
Affiliation:
Laboratoire d'Etudes et de Recherches sur les Matériaux, Unité associée CNRS 6004, Institut des Sciences de la Matière et du Rayonnement, 6 Boulevard du Maréchal Juin 14050 Caen Cedex, France, gerard@leririsl.ismra.rr
Ph. Komninou
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, karakostas@olymp.ccf.auth.gr
Th. Kehagias
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, karakostas@olymp.ccf.auth.gr
Th. Karakostas
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, karakostas@olymp.ccf.auth.gr
P. Poulopoulos
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, karakostas@olymp.ccf.auth.gr
M. Aggelakeris
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, karakostas@olymp.ccf.auth.gr
N. Flevaris
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, karakostas@olymp.ccf.auth.gr
A. Serra
Affiliation:
Universität Politècnica de Catalunya, Department de Matemàtica Aplicada III, Ets de Caminos, Canales y Puertos de Barcelona, Gran Capita, S/N Modul C2, 08034 Barcelona, Spain, serra@tsecpb.upc.es
Get access

Abstract

High resolution electron microscopy has been used to characterize the structure of ultra thin films of titanium deposited on KBr substrate by Ultra High Vacuum (UHV) electron-gun evaporation. The size of the grains has an order of magnitude of 10 nm whatever the substrate temperature. The observations have been carried out along <1123> zone axis. Some of the grains contain planar defects which were identified as the twin {1011}. The atomic structure of this twin is characterized by a mirror plane similar to that observed in polycrystalline titanium. Additionaly, this structure can be modified by a b2/2 twinning dislocation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 472: Symposium I – Polycrystalline Thin Films - Structure, Texture, Properties..III , 1997 , 391
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Gleiter, H., Nanostruct. Mater., 6, 3 (1995).Google Scholar
2. Ishida, Y., Ichinose, H., Kizuka, T. and Suenaga, K., Nanostruct. Mater., 6, 115 (1995).Google Scholar
3. Siegel, R.W., Mater. Sci. Eng., A168, 189 (1993).Google Scholar
4. Serra, A. and Bacon, D.J., Mater. Sci. For., 126–128, 69 (1993).Google Scholar
5. Hagège, S., Mori, M. and Ishida, Y., J. de Physique, Cl-51, 161 (1990).Google Scholar
6. Lay, S. and Nouet, G., Phil. Mag. A, 70, 261 (1994).Google Scholar
7. Braisaz, T., Ruterana, P., Lebouvier, B. and Nouet, G., Phys. Stat. Sol., B191, 267 (1995).Google Scholar
8. Kasukabe, Y., Yamada, Y. and Bursill, L.A., Phil. Mag. A, 67, 73 (1993).Google Scholar
9. Braisaz, T., Ruterana, P., Nouet, G., Serra, A., Komninou, Ph., Kehagias, Th. and Karakostas, Th., Phil. Mag. Lett., 74, 331 (1996).Google Scholar
10. Wang, Y.C., Ping, D.H., Li, D.X. and Ye, H.Q., Phil. Mag. Lett., 74, 367 (1996).Google Scholar
11. Ackland, G.T., Phil. Mag. A, 66, 917 (1992).Google Scholar
12. Braisaz, T., PhD, University of Caen, 1996.Google Scholar
13. Serra, A., Pond, R.C. and Bacon, D.J., Acta Metall. Mater., 39, 1469 (1991)Google Scholar
14. Braisaz, T., Komninou, Ph., Kehagias, Th., Karakostas, Th., Ruterana, P., Nouet, G. and Serra, A., Proceedings of the 8th Japan Institute of Metals International Symposium. Ed. by The Japan Institute of Metals (1996), p. 439.Google Scholar
15. Pond, R.C., Bacon, D.J. and Serra, A., Phil. Mag. Lett., 71, 275 (1995).Google Scholar