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Characterization of X-Ray Imaging Properties of PbI2 Films

Published online by Cambridge University Press:  10 February 2011

K. S. Shah
Affiliation:
RMD, Inc., 44 Hunt Street, Watertown, MA 02172
P. Bennett
Affiliation:
RMD, Inc., 44 Hunt Street, Watertown, MA 02172
L. Cirignano
Affiliation:
RMD, Inc., 44 Hunt Street, Watertown, MA 02172
Y. Dmitriyev
Affiliation:
RMD, Inc., 44 Hunt Street, Watertown, MA 02172
M. Klugerman
Affiliation:
RMD, Inc., 44 Hunt Street, Watertown, MA 02172
K. Mandal
Affiliation:
RMD, Inc., 44 Hunt Street, Watertown, MA 02172
L. P. Moy
Affiliation:
RMD, Inc., 44 Hunt Street, Watertown, MA 02172
R. A. Street
Affiliation:
Xerox PARC, Palo Alto, CA
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Abstract

This paper describes our recent research in developing vacuum sublimed lead iodide films for X-ray imaging. Lead iodide films are promising for this application due to their low dark current, high stopping efficiency, reasonably good charge transport, low cost, and relatively easy scale-up. Lead iodide films (up to 5 × 5 cm2 area) have been grown and characterized by measuring their X-ray imaging properties such as spatial resolution, and contrast transfer function. Excellent spatial resolution (> 10 lp/mm with high CTF ≈50%) has been recorded with PbI2 films. Relevant detection properties such as signal amplitude for given X-ray energy has also been measured and was found to be about 10 times larger as compared to standard phosphor screens used for X-ray imaging. Charge transport and timing characteristics of these films have been measured and the results indicate that these films should be capable of real-time operation. Application of these films for X-ray imaging such as mammography, fluoroscopy, and X-ray diffraction is addressed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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