Table of Contents - Volume 494 - Symposium V – Science & Technology of Magnetic Oxides
Editors : M. Hundley, J. Nickel, R. Ramesh, Y. Tokura
a1 Dcpt. Materials Science and Engineering, Cornell University, Ithaca, NY 14853
a2 Bell Labs, Lucent Technologies, 600 Mountain Ave., Murray Hill, NJ 07974
a3 Joint Research Center for Atom Technology, Tsukuba 305, Japan
a4 Dept. of Applied Physics, University of Tokyo, Tokyo, Japan
ABSTRACT
We have investigated the magnetic anisotropies of doped manganite materials in epitaxial thin film and single crystal form. Structural characterization, including x-ray diffraction, Rudierford backscattering spectroscopy and atomic force misocroscopy, indicate that our epitaxial films arc single crystalline and have excellent crystallinity. Since lattice distortions greatly affect the magnetic and transport properties of this family of materials, it is not surprising to find the profound effect of strain in films due to the lattice mismatch between the substrate and film. Magnetic anisotropy results of single crystals, subject to no external stress, is compared to those of epitaxial films.