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Interface Conduction between Conductive ReO3 Thin Film and NdBa2Cu3O6 Thin Film

Published online by Cambridge University Press:  11 February 2011

Manabu Ohkubo ,
Kumiko Fukai ,
Kohji Matsuo ,
Nobuyuki Iwata  and
Hiroshi Yamamoto
Manabu Ohkubo
Affiliation:
Department of Electronics & Computer Science, College of Science & Technology, Nihon University, 7–24–1 Narashinodai, Funabashi-shi, Chiba 274–8501, Japan
Kumiko Fukai
Affiliation:
Department of Electronics & Computer Science, College of Science & Technology, Nihon University, 7–24–1 Narashinodai, Funabashi-shi, Chiba 274–8501, Japan
Kohji Matsuo
Affiliation:
Department of Electronics & Computer Science, College of Science & Technology, Nihon University, 7–24–1 Narashinodai, Funabashi-shi, Chiba 274–8501, Japan
Nobuyuki Iwata
Affiliation:
Department of Electronics & Computer Science, College of Science & Technology, Nihon University, 7–24–1 Narashinodai, Funabashi-shi, Chiba 274–8501, Japan
Hiroshi Yamamoto
Affiliation:
Department of Electronics & Computer Science, College of Science & Technology, Nihon University, 7–24–1 Narashinodai, Funabashi-shi, Chiba 274–8501, Japan
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Abstract

The Re oxide films were deposited on quartz glasses by RF reactive sputtering from a Re metal target. The lowest resistivity was observed in the film in-situ annealed at 200°C in Ar atmosphere and showed the order of 10-4 Ω cm of which the value was still about 10 times as large as that of a single crystal ReO3. The temperature dependence of the resistivity revealed a metallic behavior. A superconductivity did not take place in the bilayered film of ReO3 / NdBa2Cu3O6. In the interface region the resistivity minimum probably caused by the Kondo effect was observed in the neighborhood of 120K.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 740: Symposium I – Nanomaterials for Structural Applications , 2002 , I3.30
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1. Feinleib, J., Scouler, W. J., Ferretti, A., Physical Review, 165, 765(1968).Google Scholar
2. Pearsall, T. P. and Lee, C. A., Physical Review B, 10, 2190(1974).Google Scholar
3. Kondo, J., Prog. Theor. Phys., 32, 37(1964).Google Scholar