Journal of Materials Research


Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy

Wenge Yanga1, B.C. Larsona1, G.M. Pharra2a), G.E. Icea3, J.D. Budaia3, J.Z. Tischlera3 and Wenjun Liua3

a1 Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831

a2 Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and University of Tennessee, Knoxville, Tennessee 37996

a3 Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831


The use of three-dimensional x-ray structural microscopy for nondestructive investigations of the deformation microstructure under microindents was demonstrated. Point to point, micrometer-resolution x-ray microbeam measurements of local lattice rotations were made for selected positions under 100-mN Berkovich and conical indents in single-crystal copper. Local lattice orientation measurements were used to extract micrometer by micrometer lattice misorientations and rotation axes along x-ray microbeams. Measurements of the deformation microstructure in symmetry and off-symmetry geometries are reported and discussed in terms of their potential for fundamental deformation investigations.

(Received June 06 2003)

(Accepted August 18 2003)

Key Words:

  • Indentation;
  • X-ray diffraction (XRD);
  • Microstructure


a) This author was an editor of this focus issue during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to