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Defect-dependent Elasticity: Nanoindentation as a Probe of Stress State

Published online by Cambridge University Press:  31 January 2011

K. F. Jarausch ,
J. D. Kiely ,
J. E. Houston  and
P. E. Russell
K. F. Jarausch
Affiliation:
North Carolina State University, Raleigh, North Carolina 27695-753
J. D. Kiely
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1415
J. E. Houston
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1415
P. E. Russell
Affiliation:
North Carolina State University, Raleigh, North Carolina 27695-7531
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Abstract

Using an interfacial force microscope, the measured elastic response of 100-nm-thick Au films was found to be strongly correlated with the films' stress state and thermal history. Large, reversible variations (2×) of indentation modulus were recorded as a function of applied stress. Low-temperature annealing caused permanent changes in the films' measured elastic properties. The measured elastic response was also found to vary in close proximity to grain boundaries in thin films and near surface steps on single-crystal surfaces. These results demonstrate a complex interdependence of stress state, defect structure, and elastic properties in thin metallic films.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 8 , August 2000 , pp. 1693 - 1701
Copyright
Copyright © Materials Research Society 2000

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