Journal of Materials Research

Articles

Refractive index profile and attenuation measurement in KTiOPO4 waveguide by megaelectronvolt He ions

Ke-Ming Wanga1, Hiu Hua1, Fei Lua1, Feng Chena1, Bo-Rong Shia1, Yao-Gang Liua2, Ding-Yu Shena3 and Xie-Mei Wanga3

a1 Department of Physics, Shandong University, Jinan 250100, Shandong, People's Republic of China

a2 Institute of Crystal Materials, Shandong University, Jinan 250100, Shandong, People's Republic of China

a3 MOE Laboratory of Heavy Ion Physics, Peking University, Beijing 100871, People's Republic of China

Abstract

An optically polished x-cut KTiOPO4 crystal of size 22×6×1.5mm3 was implanted with 2.8-MeV He ions to a dose of 1.5 × 1016 ions/cm2 at room temperature to form a waveguide. The prism coupling method was used to measure the modes and the fiber probe technique was used to measure the attenuation in the KTiOPO4 waveguide. The refractive index profile, nz, in the KTiOPO4 waveguide was given based on the procedure by Chandler and Lama [P.J. Chandler and F.L. Lama, Optica Acta 33, 123 (1986)]. The waveguide attenuation measured was 2.57 dB/cm for m = 1 mode. After annealing at 260 °C for 30 min, there was no obvious change in the KTiOPO4 waveguide attenuation.

(Received February 24 2000)

(Accepted October 16 2000)

0Comments