Journal of Materials Research

Articles

On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

H. G. Jianga1, M. Rühlea2 and E. J. Laverniaa3

a1 Department of Chemical, Biochemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575

a2 Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174 Stuttgart, Germany

a3 Department of Chemical, Biochemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575

Abstract

Measurements of x-ray diffraction (XRD) profiles have been performed on commercially pure Fe and Al powders, cryomilled Fe–3 wt.% Al powders, cold pressed (CP) pure Fe and Al, hot pressed (HP) and hot isostatically pressed (HIP) Fe–3 wt.% Al. Scherrer equation (SE), integral breadth analysis (IBA), and single-line approximation (SLA) methods have been employed to extract grain size and microstrain. The results demonstrate that, in the case of the cryomilled nanocrystalline Fe–3 wt.% Al powders, all these XRD techniques yielded reasonable, consistent grain size results. However, discrepancies were found in cold pressed (CP-Fe), hot pressed (HP-Fe–3 wt.% Al), and hot isostatically pressed (HIP-Fe–3 wt.% Al) samples. TEM imaging revealed the presence of a certain density of dislocations inside the grains in the HP-Fe–3 wt.% Al and HIP-Fe–3 wt.% Al, which is thought to be partly or fully responsible for the observed discrepancies.

(Received January 06 1997)

(Accepted May 14 1998)

0Comments
Related Content