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Interfaces between solution-derived LiMn2O4 thin films and MgO and Au/MgO substrates

Published online by Cambridge University Press:  31 January 2011

Yumi H. Ikuhara ,
Xiuliang Ma ,
Yuji Iwamoto ,
Yuichi Ikuhara ,
Koichi Kikuta  and
Shin-ichi Hirano
Yumi H. Ikuhara
Affiliation:
Japan Fine Ceramics Center, 2–4–1 Mutsuno, Atsuta-ku, 456–8587, Nagoya, Japan
Xiuliang Ma
Affiliation:
Engineering Research Institute, University of Tokyo 2–11–16, Yayoi, Bunkyo-ku 113–8656, Tokyo, Japan
Yuji Iwamoto
Affiliation:
Japan Fine Ceramics Center, 2–4-1 Mutsuno, Atsuta-ku, 456–8587, Nagoya, Japan
Yuichi Ikuhara
Affiliation:
Engineering Research Institute, University of Tokyo 2–11–16, Yayoi, Bunkyo-ku 113–8656, Tokyo, Japan
Koichi Kikuta
Affiliation:
Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, 464–8603, Nagoya, Japan
Shin-ichi Hirano
Affiliation:
Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, 464–8603, Nagoya, Japan
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Abstract

Spinel LiMn2O4 thin films have been prepared on MgO(110) and Au/MgO(110) substrates by a chemical solution deposition method. The interfaces between film and substrate were characterized by means of high-resolution transmission electron microscopy (HREM) as well as x-ray diffraction. Cross-sectional HREM observation revealed that LiMn2O4 films grew epitaxially on the MgO(110) and Au/MgO(110) substrates. In the LiMn2O4/MgO system, misfit dislocations formed to accommodate the lattice strain at the LiMn2O4/MgO interface. In the LiMn2O4/Au/MgO system, Au grew epitaxially on the MgO substrate with its surface facetted along {111} planes, probably because the surface energy of this plane is relatively low. The formation of these facets is considered to have a favorable effect on the growth of {111} planes of LiMn2O4 when deposited on the Au film.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 2 , February 2002 , pp. 358 - 366
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1.Thackeray, M.M., Johnson, P.J., Picciotto, L.A. de, Bruce, P.G., and Goodenough, J.B., Mater. Res. Bull. 19, 179 (1984).CrossRefGoogle Scholar
2.Bach, S., Pereira-Ramos, J.P., Baffier, N., and Messina, R., Electrochim. Acta 37, 1301 (1992).CrossRefGoogle Scholar
3.Rossouw, M.H., Kock, A. de, Picciotto, L.A. de, Thackeray, M.M., David, W.I.F., and Ibberson, R.M., Mater. Res. Bull. 25, 173 (1990).CrossRefGoogle Scholar
4.Ohzuku, T., Kitagawa, M., and Taketsugu, H., J. Electrochem. Soc. 137, 769 (1990).CrossRefGoogle Scholar
5.Huang, H. and Bruce, P.G., J. Electrochem. Soc. 141, 185 (1994).CrossRefGoogle Scholar
6.Tarascon, J.M., McKinnon, W.R., Coowar, F., Bowmer, T.N., Amatucci, G., and Guyomard, D., J. Electrochem. Soc. 141, 1421 (1994).CrossRefGoogle Scholar
7.Gummow, R.J., Kock, A. de, and Thackeray, M.M., Solid State Ionics 69, 59 (1994).CrossRefGoogle Scholar
8.Masquelier, C., Tabuchi, M., Ando, K., Kanno, R., Kobayashi, Y., Maki, Y., Nakamura, O., and Goodenough, J.B., J. Solid State Chem. 123, 256 (1996).CrossRefGoogle Scholar
9.Guyomard, D. and Tarascon, J.M., J. Electrochem. Soc. 139, 937 (1992).CrossRefGoogle Scholar
10.Ikuhara, Y.H., Iwamoto, Y., Kikuta, K., and Hirano, S., J. Mater. Res. 14, 3102 (1999).CrossRefGoogle Scholar
11.Ikuhara, Y.H., Iwamoto, Y., Kikuta, K., and Hirano, S., Ionics 6, 156 (2000).CrossRefGoogle Scholar
12.Reimers, J.N. and Dahn, J.R., J. Electrochem. Soc. 139, 2091 (1992).CrossRefGoogle Scholar
13.Gummow, R.J., Liles, D.C., Thackeray, M.M., and David, W.I.F., Mater. Res. Bull. 28, 1177 (1993).CrossRefGoogle Scholar
14.Thomas, M.G.S.R., David, W.I.F., Goodenough, J.B., and Gloves, P., Mater. Res. Bull. 20, 1137 (1985).CrossRefGoogle Scholar
15.Dahn, J.R., Sacken, U. von, and Michael, C.A., Solid State Ionics 44, 87 (1990).CrossRefGoogle Scholar
16.Hirano, A., Kanno, R., Kawamoto, Y., Takeda, Y., Yamaura, K., Takano, M., Ohyama, K., Ohashi, M., and Yamaguchi, Y., Solid State Ionics 78, 123 (1995).CrossRefGoogle Scholar
17.Fragnaud, P., Nagarajan, R., Scaleich, D.M., and Vujic, D., J. Power Sources 54, 362 (1995).CrossRefGoogle Scholar
18.Shokoohi, F.K., Tarascon, J.M., and Wilkens, B.J., Appl. Phys. Lett. 59, 1260 (1991).CrossRefGoogle Scholar
19.Shokoohi, F.K., Tarascon, J.M., Tarascon, J.M., Wilkens, B.J., Guyomard, D., and Chang, C.C., J. Electrochem. Soc. 139, 1845 (1992).CrossRefGoogle Scholar
20.Antaya, M., Dahn, J.R., Preston, J.S., Rosen, E., and Reimers, J.N., J. Electrochem. Soc. 140, 575 (1993).CrossRefGoogle Scholar
21.Antaya, M., Clearns, K., Preston, J.S., Reimers, J.N., and Dahn, J.R., J. Appl. Phys. 76, 2799 (1994).CrossRefGoogle Scholar
22.Hwang, K-H., Lee, S-H., and Joo, S-K., J. Electrochem. Soc. 141, 3296 (1994).CrossRefGoogle Scholar
23.Bates, J.B., Gruzalski, G.R., Dadney, N.J., Luck, C.F., and Yu, X., Solid State Ionics 70/71, 619 (1994).CrossRefGoogle Scholar
24.Bates, J.B., Lubben, D., Dudney, N.J., and Harf, F.X., J. Electrochem. Soc. 142, L149 (1995).CrossRefGoogle Scholar
25.Mader, W. and Rühle, M., Acta Metall. 37, 853 (1989).CrossRefGoogle Scholar
26.Metal-Ceramic Interfaces, edited by Rühle, M., Evans, A.G., Ashby, M.F., and Hirth, J.P. (Pergamon, Oxford, United Kingdom, 1990).Google Scholar
27.Ikuhara, Y., Pirouz, P., Yadavalli, S., and Flynn, C.P., Philos. Mag. A 72, 179 (1995).CrossRefGoogle Scholar
28.Ikuhara, Y.H., Iwamoto, Y., Kikuta, K., and Hirano, S., J. Mater. Res. 15, 2750 (2000).CrossRefGoogle Scholar
29.Ikuhara, Y.H., Iwamoto, Y., Kikuta, K., and Hirano, S., Ceram. Trans. 83, 53 (1998).Google Scholar
30.Nakao, S., Saitoh, K., Ikeyama, M., Niwa, H., Tanemura, S., Miyagawa, Y., and Miyagawa, S., Surf. Coat. Technol. 66, 464 (1994).CrossRefGoogle Scholar
31.Merwe, J.H. Van Der, J. Appl. Phys. 34, 1171 (1963).Google Scholar
32.Bollmann, W., Crystal Defects and Crystalline Interfaces (Springer, Berlin, Germany, 1970).CrossRefGoogle Scholar
33.Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W., and Whelan, M.J., Electron Microscopy of Thin Crystals (Butter-worths, London, United Kingdom, 1965).Google Scholar
34.Ajayan, P.M. and Marks, L.D., Phys. Rev. Lett. 17, 279 (1989).CrossRefGoogle Scholar
35.Kizuka, T. and Tanaka, N., Phys. Rev. B 56, 10079 (1997).CrossRefGoogle Scholar