Journal of Materials Research

Articles

Optical properties of AlN determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry data

D. J. Jonesa1, R. H. Frencha1 c1, H. Müllejansa2 p1, S. Loughina3, A. D. Dorneicha4 and P. F. Carciaa5

a1 DuPont Central Research, E356–384 Experimental Station, Wilmington, Delaware 19880

a2 Max-Planck-Institut für Metallforschung, Seestraße 92, D-70174 Stuttgart, Germany

a3 DuPont Central Research, E356–384 Experimental Station, Wilmington, Delaware 19880

a4 Max-Planck-Institut für Metallforschung, Seestraße 92, D-70174 Stuttgart, Germany

a5 DuPont Central Research, E356-384 Experimental Station, Wilmington, Delaware 19880

Abstract

Precise and accurate knowledge of the optical properties of aluminum nitride (AlN) in the ultraviolet (UV) and visible (VIS) regions is important because of the increasing application of AlN in optical and electro-optical devices, including compact disks, phase shift lithography masks, and AlN/GaN multilayer devices. The interband optical properties in the vacuum ultraviolet (VUV) region of 6–44 eV have been investigated previously because they convey detailed information on the electronic structure and interatomic bonding of the material. In this work, we have combined spectroscopic ellipsometry with UV/VIS and VUV spectroscopy to directly determine the optical constants of AlN in this range, thereby reducing the uncertainty in the preparation of the low-energy data extrapolation essential for Kramers–Kronig analysis of VUV reflectance. We report the complex optical properties of AlN, over the range of 1.5–42 eV, showing improved agreement with theory when contrasted with earlier results.

(Received November 02 1998)

(Accepted August 03 1999)

Correspondence:

c1 Address all correspondence to this author. e-mail: roger.h.french@usa.dupont.com

p1 Present address: Institute for Advanced Materials, Joint Research Centre, European Commission, PO Box 2, NL–1755 ZG Petten, The Netherlands.

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