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Heavy Doping of Li+-ion into NiO Epitaxial Thin Films via Unequilibrium Room-temperature Processing for New Functionalization

Published online by Cambridge University Press:  31 January 2011

Naoki Shiraishi
Affiliation:
shiraishi.n.ab@m.titech.ac.jpyoshimoto.m.aa@m.titech.ac.jp, Tokyo Institute of Technology, Department of Innovative and Engineered Materials, Kanagawa, Japan
Yushi Kato
Affiliation:
kato.y.am@m.titech.ac.jp, Tokyo Institute of Technology, Department of Innovative and Engineered Materials, Kanagawa, Japan
Hideki Arai
Affiliation:
arai.h.ae@m.titech.ac.jp, Tokyo Institute of Technology, Department of Innovative and Engineered Materials, Kanagawa, Japan
Nobuo Tsuchimine
Affiliation:
tsuchimine@hotmail.com, TOSHIMA Manufacturing Company Limited, Saitama, Japan
Susumu Kobayashi
Affiliation:
whitestone1985@hotmail.com, TOSHIMA Manufacturing Company Limited, Saitama, Japan
Masahiko Mitsuhashi
Affiliation:
mitsu@kanagawa-iri.go.jp, Kanagawa Industrial Technology Research Institute, Kanagawa, Japan
Masayasu Soga
Affiliation:
msoga@kanagawa-iri.go.jp, Kanagawa Industrial Technology Research Institute, Kanagawa, Japan
Mamoru Yoshimoto
Affiliation:
yoshimoto.m.aa@m.titech.ac.jp, Tokyo Institute of Technology, Department of Innovative and Engineered Materials, Kanagawa, Japan
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Abstract

NiO is a typical material for new p-type oxide semiconductors. Conductivity of NiO can be raised with Li+ doping. In case of Li-heavy doping, we can obtain LixNiO2(0.5< × <1.0). Recently the importance of LiNiO2 has been increased as an electrode material for rechargeable lithium cells.

In this work, we tried to fabricate a novel NiO material with Li+-heavily doped by applying the pulsed laser-induced room temperature (R.T.) film process. Previously, we have succeeded in the epitaxial growth of various oxide thin films at R.T. such as Sn-doped In2O3 transparent electrodes [1]. Although the many studies have been made on the deposition of NiO epitaxial thin film at low temperatures [2], there are few reports on fabrication and the conductive characteristic for Li-heavily doped NiO epitaxial films. The film deposition at R.T., which is the unequilibrium vapor phase process, is expected to result in different crystal structure and characteristics from the films grown at high-temperatures.

A composition-adjusted thin film of LixNi1-xO(0.10< × <0.40) was deposited on a sapphire (α-Al2O3)(0001) or MgO(100) substrates by pulsed laser deposition (PLD) technique in 10−6 Torr of oxygen at R.T. and the high temperatures of 350 and 515°C. Crystalline properties of thin films deposited at R.T. or high temperatures were examined using reflection high energy electron diffraction (RHEED) and X-ray diffraction. For the Li-heavily doped NiO films(x>0.30) grown at R.T., a clear streak RHEED pattern showing epitaxial growth was observed. But the Li-heavily doped NiO films grown at high temperatures, exhibited the ring RHEED pattern, which indicates the policrystal growth of films. Electric conductivity of various Li-doped NiO thin films deposited at R.T. or high temperatures on sapphire (0001) substrates were measured by two-probe method. The interesting results were obtained that conductivity of the film was increased remarkably with an increase of Li-doping for R.T. deposition, but was not changed so much regardless of Li-doping for high-temperature depositions.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

1. Chiba, H., Murakami, K., Eryu, O., Shihoyama, K., Mochizuki, T., Masuda, K., Jpn. J. Appl. Phys. 30 (1991) 732.Google Scholar
2. Yoshimoto, M., Shimozono, K., Maeda, T., Ohnishi, T., Kumagai, M., Chikyo, T., Ishiyama, O., Shinohara, M., Koinuma, H., Jpn. J. Appl. Phys. 34 (1995) 688.Google Scholar
3. Hosaka, M., Akita, Y., Sugimoto, Y., Koyama, K., Yoshimoto, M., Jpn. J. Appl. Phys. 48 (2009) 088003.Google Scholar
4. Sasaki, A., Hara, W., Matsuda, A., Tateda, N., Otaka, S., Akiba, S., Saito, K., Yodo, T., Yoshimoto, M., Appl. Phys. Lett. 86 (2005) 231911.Google Scholar
5. Tashiro, J., Sasaki, A., Akiba, S., Satoh, S., Watanabe, T., Funakubo, H., Yoshimoto, M., Thin Solid Films 415 (2002) 272.Google Scholar
6. Matsuda, A., Akiba, S., Kasahara, M., Watanabe, T., Akita, Y., Yoshimoto, M., Appl. Phys. Lett. 90 (2007) 182107.Google Scholar
7. Akiba, S., Matsuda, A., Isa, H., Kasahara, M., Sato, S., Watanabe, T., Hara, W., Yoshimoto, M., Appl. Phys. Nanotech. 17 (2006) 4053.Google Scholar
8. Tsuda, N., Nasu, K., Fujimori, A., Siratori, K.: Electronic Conduction in oxides (Springer-Veralg, Heidelberg, 1991) Springer Series in Solid State Sciences Vol. 94, Chap. 5.6.2.Google Scholar
9. Joshi, U. S., Matsumoto, Y., Itaka, K., Sumiya, M., Koinuma, H., Appl. Surf. Sci. 252 (2006) 2524.Google Scholar
10. Ohta, H., Kamiya, M., Kamiya, T., Hirano, M., Hideo, H.. Thin Solid Films 445 (2003) 317.Google Scholar
11. Shin, W., Murayama, N., Mater. Lett. 45 (2000) 302.Google Scholar
12. Matsumiya, M., Qiu, F., Shin, W., Izu, N., Murayama, N., Kanzaki, S., Thin Solid Films 419 (2002) 213.Google Scholar
13. Stamataki, M., Tsamakis, D., Brilis, N., Fasaki, I., Giannoudakos, A., Kompitsas, M., Phys. State Solid (a) 205 (2008) 2064.Google Scholar
14. Dirksen, J.A., Duval, K., Ring, T.A., Sens. Actuators B 80 (2001) 106.Google Scholar
15. Tarascon, J.M., Armand, M., Nature 414 (2001) 361.Google Scholar
16. Tachiki, M., Hosomi, T., Kobayashi, T., Jpn. J. Appl. Phys. 39 (2000) 1817.Google Scholar
17. Kakehi, Y., Nakao, S., Satoh, K., Kusaka, T., J. Cryst. Growth 237 (2002) 591.Google Scholar
18. Yoshimoto, M., Maeda, T., Ohnishi, T., Koinuma, H., Ishiyama, O., Shinohara, M., Kubo, M., Miura, R., Miyamoto, A., Appl. Phys. Lett. 67 (1995) 2615.Google Scholar
19. Tasker, P.W., J. Phys. C. Solid State Phys. 12 (1979) 4977.Google Scholar
20. Chen, H.L., Yang, Y.S., Thin Solid Films 516 (2008) 5590.Google Scholar