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Red-Green-Blue MOSLED Made by PECVD Grown SiOx with Detuning RF Plasma Power

Published online by Cambridge University Press:  31 January 2011

Chih-Hsien Cheng
Affiliation:
shouham@hotmail.com, National Taiwan University, Institute of Photonics and Optoelectronics, and Department of Electrical Engineering, Taipei, Taiwan, Province of China
Bo-Han Lai
Affiliation:
f97941009@ntu.edu.tw, National Taiwan University, Institute of Photonics and Optoelectronics, and Department of Electrical Engineering, Taipei, Taiwan, Province of China
Gong-Ru Lin
Affiliation:
grlin@ntu.edu.tw, National Taiwan University, No. 1 Roosevelt Road Sec. 4, Taipei, 10617, Taiwan, Province of China
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Abstract

Si quantum dot (Si-QD) based multi-color metal oxide semiconductor lighting emission diodes (MOSLEDs) made on Si-rich SiOx grown by detuning RF plasma power in a plasma enhanced chemical vapor deposition (PECVD) system are demonstrated. With the RF plasma powers increasing from 50 to 70 W at 10 W increment, the turn-on voltage and maximum electroluminescence (EL) power red-, green- and blue-color MOSLEDs increase from 70, 90 and 99 V and 7, 26 and 55 nW, respectively. The power-current slope of 0.51, 3.24 and 53.82 mW/A are obtained for these MOSLEDs with corresponding power conversion ratio (PCR) of 5.13×10-6, 2.52×10-5 and 2.47×10-4. Both the turn-on voltage and power slope linearly increase with enhancing thickness of the Si-QD based MOSLED.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

11. Linnros, J. and Lalic, N., Appl. Phys. Lett., vol. 66, pp. 3048 (1995).Google Scholar
2 Liu, Y., Chen, T.P., Ding, L., Yang, M., Wong, J.I., Ng, C.Y., Yu, S.F., Li, Z.X., and Yuen, C., J. Appl. Phys., vol. 101, 104306 (2007).Google Scholar
3 Wang, M., Huang, X., Xu, J., Li, W., Liu, Z., and Chena, K., Appl. Phys. Lett., vol. 72, pp. 722 (1998).Google Scholar
4 Jambois, O., Rinnert, H., Devaux, X., and Vergnat, M., J. Appl. Phys., vol. 98, 046105 (2005).Google Scholar
5 Lin, G.-R. and Lin, C.J., Appl. Phys. Lett., vol. 91, 072103 (2007)Google Scholar
6 Mead, C. A., Phys. Rev., vol. 128, pp. 2088 (1962).Google Scholar
7 Sze, S., J. Appl. Phy., vol. 38, pp. 2951 (1967).Google Scholar
8 Chen, J., Lee, T., Su, J., Wang, W., and Reed, M.A., Encyclopedia of Nanoscience and Nanotechnology (American Scientific Publishers, Valencia, California, 2004), 5, 633 (2004).Google Scholar