Journal of Materials Research

Articles

The most powerful tool for the structural analysis of tungsten suboxide nanowires: Raman spectroscopy

Dong Yu Lua1, Jian Chena2 c1, Shao Zhi Denga3, Ning Sheng Xua3 c2 and Wei Hong Zhanga4

a1 State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Materials and Technologies, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China

a2 State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Materials and Technologies, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China; and Instrumentation Analysis and Research Center, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China

a3 State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Materials and Technologies, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China

a4 Instrumentation Analysis and Research Center, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China

Abstract

Crystalline tungsten suboxide nanowires were grown on silicon substrates by thermal evaporation of tungsten powder in a flow of argon gas without any catalyst. With different growth temperatures, two kinds of tungsten suboxide nanowires (W18O49 and W20O58) were obtained. The structures, morphologies, and compositions of these two nanowires were characterized by scanning electron microscopy (SEM), electron probe microanalyzer (EPMA), x-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), x-ray photoelectron spectroscopy (XPS), and Raman techniques. The results show that XRD and TEM are not good characterization techniques for identifying W18O49 and W20O58 nanowires; however, Raman spectroscopy (RS) is a powerful tool to distinguish the difference between them. This is due to the notable molecular bond contributing to the vibrational frequency.

(Received May 4 2007)

(Accepted October 15 2007)

Key Words:

  • Nanostructure;
  • Raman spectroscopy

Correspondence:

c1 a) Address all correspondence to these authors. e-mail: puscj@mail.sysu.edu.cn

c2 b) Address all correspondence to these authors. e-mail: stsxns@mail.sysu.edu.cn

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