MRS Bulletin

Technical Feature

Technical Feature

In Situ Transmission Electron Microscopy

P.J. Ferreira, K. Mitsuishi and E.A. Stach

Abstract

The articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes. They can validate static TEM experiments and inspire new experimental approaches and new theories.

Paulo J. Ferreira, Guest Editor for this issue of MRS Bulletin, is an assistant professor at the University of Texas at Austin. Ferreira earned his PhD degree in materials science and engineering from the University of Illinois. He completed his post-doctoral work in materials science and engineering at the Massachusetts Institute of Technology. Ferreira concentrates his scientific research on the study of the atomic structure and defect behavior of nanomaterials through in situ and high-resolution transmission electron microscopy techniques. He is part of the editorial board of review for Metallurgical and Materials Transactions. Ferreira also has acted as a special advisor to the Minister of Economics and Innovation, Portugal, on Government Strategy for Science & Technology. In addition, Ferreira is the author or co-author of more than 70 papers, conference proceedings, and book chapters. He is preparing a book entitled “Nanomaterials, Nanotechnologies and Design: An Introduction for Engineers and Architects” with coauthors D. Schodek (Harvard University) and M. Ashby (University of Cambridge, UK).

Ferreira can be reached at the University of Texas at Austin, Materials Science and Engineering Program, 1 University Station, MC 2200, Austin, TX 78712-0292, USA; tel. 512-471-3244, and e-mail ferreira@mail.utexas.edu.

Kazutaka Mitsuishi, Guest Editor for this issue of MRS Bulletin, is a senior scientist at Quantum Dot Research Center in the National Institute for Materials Science (NIMS), Japan. Mitsuishi also is affiliated in the highvoltage electron microscopy station at NIMS. He received his PhD degree in 1996 from Tokyo University of Science, studying dynamical simulation of a RHEED intensity oscillation during MBE growth. Mitsuishi's research interests include imaging properties and simulation techniques on scanning transmission electron microscopy, in situ observation of rare-gas precipitates in metals, and in situ fabrication of nanostructures using electron beam-induced deposition.

Mitsuishi can be reached at Quantum Dot Research Center, National Institute for Materials Science, 3–13 Sakura, Tsukuba 305–0003 Japan; tel. +81-29-863-5474, fax +81-29-863-5574, and e-mail Mitsuishi.Kazutaka@nims.go.jp.

Eric A. Stach, Guest Editor for this issue of MRS Bulletin, is an associate professor in the Department of Materials Engineering at Purdue University and scientific director of the Electron Microscopy Facility at the Birck Nanotechnology Center. He received his PhD degree in 1998 in materials science and engineering from the University of Virginia. Prior to joining Purdue, Stach was the in situ staff scientist (1998–2003) and a principal investigator (2003–2004) at the National Center for Electron Microscopy. He also is chief scientist and co-founder of Humming bird Scientific, LLC; a manufacturer of sample holders for electron and ion microscopy applications. Stach's research interests focus on the development and application of in situ electron microscopy techniques toward understanding crystal growth and deformation mechanisms.

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