Journal of Materials Research

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Erratum: “Grazing incidence synchrotron x-ray diffraction method for analyzing thin films” [J. Mater. Res. 2,471 (1987)]

G. Lima1, W. Parrisha1, C. Ortiza1, M. Bellottoa2 and M. Harta3

a1 IBM Almaden Research Center, San Jose, California 95120-6099

a2 Università di Brescia, 25060 Brescia, Italy

a3 Department of Physics, The University, Manchester M13 9PL, United Kingdom

(Received December 11 1987)

(Accepted December 14 1987)

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