Microscopy and Microanalysis


Physical Sciences Symposia

Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)

B McMorrana1, D Piercea1 and J Ungurisa1

a1 National Institute of Standards and Technology

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.