Microscopy and Microanalysis


Instrumentation and Techniques Symposia

Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

OL Krivaneka1, N Dellbya1, MF Murfitta1, ZS Szilagyia1, MF Chisholma2 and K Suenagaa3

a1 Nion Co

a2 Oak Ridge National Laboratory

a3 National Institute of Advanced Industrial Science and Technology

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.