Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

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Microscopy and Microanalysis

Microscopy and Microanalysis / Volume 16 / Supplement S2 / July 2010, pp 70-71
Copyright © Microscopy Society of America 2010
DOI: http://dx.doi.org/10.1017/S1431927610056965 (About DOI), Published online: 01 August 2010

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Instrumentation and Techniques Symposia

Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

Article author query
krivanek o [PubMed] [Google Scholar]
dellby n [PubMed] [Google Scholar]
murfitt m [PubMed] [Google Scholar]
szilagyi z [PubMed] [Google Scholar]
chisholm m [PubMed] [Google Scholar]
suenaga k [PubMed] [Google Scholar]

OL Krivanek^a1, N Dellby^a1, MF Murfitt^a1, ZS Szilagyi^a1, MF Chisholm^a2 and K Suenaga^a3

^a1Nion Co

^a2Oak Ridge National Laboratory

^a3National Institute of Advanced Industrial Science and Technology

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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@article{MAM:7841099,
author = {Krivanek,OL and Dellby,N and Murfitt,MF and Szilagyi,ZS and Chisholm,MF and Suenaga,K},
title = {Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM},
journal = {Microscopy and Microanalysis},
volume = {16},
issue = {Supplement S2},
month = {6},
year = {2010},
issn = {1435-8115},
pages = {70--71},
numpages = {2},
doi = {10.1017/S1431927610056965},
URL = {http://journals.cambridge.org/article_S1431927610056965},
}

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<div style="background: #FFFFFF; margin: 0 10px 10px 0; padding: 0 10px 0 0; text-align: left; font-family: Arial, Helvetica, sans-serif; line-height: 1em;"><div style="font-size: 11px; padding: 0px 0px 10px 0px; font-weight:bold; color: #045989;">Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM</div><div style="font-size: 11px;"><b>
					OL Krivanek,
					N Dellby,
					MF Murfitt,
					ZS Szilagyi,
					MF Chisholm
					 and K Suenaga (2010).	</b><br /><a href="http://journals.cambridge.org/action/displayJournal?jid=MAM">Microscopy and Microanalysis</a>, <a href="http://journals.cambridge.org/action/displayJournal?jid=MAM&volumeId=16&bVolume=y#loc16>
				 ">Volume 16</a>, <a href="http://journals.cambridge.org/action/displayIssue?jid=MAM&volumeId=16&issueId=S2&seriesId=0">SupplementS2</a>, July 2010 pp 70-71<br/>
<a href="http://journals.cambridge.org/action/displayAbstract?aid=7841099">http://journals.cambridge.org/action/displayAbstract?aid=7841099</a></div></div>

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Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

OL Krivanek, N Dellby, MF Murfitt, ZS Szilagyi, MF Chisholm and K Suenaga July 2010
Microscopy and Microanalysis, ,Volume16, SupplementS2, July 2010 pp 70-71
http://journals.cambridge.org/abstract_S1431927610056965

OL Krivanek, N Dellby, MF Murfitt, ZS Szilagyi, MF Chisholm and K Suenaga (2010). Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM. Microscopy and Microanalysis, 16 (Suppl. 2) , pp 70-71. doi:10.1017/S1431927610056965.

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Microscopy and Microanalysis

Abstract

Instrumentation and Techniques Symposia

Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

OL Krivaneka1, N Dellbya1, MF Murfitta1, ZS Szilagyia1, MF Chisholma2 and K Suenagaa3

OL Krivanek^a1, N Dellby^a1, MF Murfitt^a1, ZS Szilagyi^a1, MF Chisholm^a2 and K Suenaga^a3