Microscopy and Microanalysis

Abstract

Instrumentation and Techniques Symposia

Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

AP Hitchcocka1, T Tyliszczaka2, M Obsta3, G Swerhonea4 and J Lawrencea4

a1 McMaster University, Canada

a2 Lawrence Berkeley National Laboratory

a3 Eberhard Karls University Tuebingen, Germany

a4 National Water Research Institute

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.