a1 Department of Electronics, University of Pavia, Via Ferrata 1, 27100 Pavia, Italy. Phone: +39 0382 985223; Fax: +39 0382 422583.
a2 Poly-Grames Research Center, École Polytechnique de Montréal, 2500, Chemin de Polytechnique, Montréal, Québec H3T 1J4, Canada
This paper presents a study of losses in substrate-integrated waveguides (SIWs) and cavities. Three mechanisms of losses are considered and separately investigated, namely radiation leakage, ohmic loss, and dielectric loss. A systematic comparison of waveguides with different geometry, operating at different frequencies, is reported. This study permits to give a physical interpretation of the loss mechanisms and to identify design criteria to minimize losses. A similar analysis is also developed in this work for the case of SIW resonant cavities. For these structures, a different variation of losses with respect to frequency is found, which reduces the effectiveness of the design criteria established for SIWs.
(Received February 18 2009)
(Revised May 14 2009)
(Online publication September 02 2009)