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Characterization of CVD Graphene Films on Ni Substrate by EBSD and Low-kV EDS

Published online by Cambridge University Press:  26 July 2009

DC Bell
Affiliation:
Harvard University
N Erdman
Affiliation:
JEOL USA
J Kong
Affiliation:
Massachusetts Institute of Technology
A Reina
Affiliation:
Massachusetts Institute of Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009