Cambridge Journals Online - Microscopy and Microanalysis - Abstract - Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM

Microscopy and Microanalysis

Microscopy and Microanalysis / Volume 15 / Supplement S2 / July 2009, pp 1416-1417
Copyright © Microscopy Society of America 2009
DOI: http://dx.doi.org/10.1017/S1431927609094744 (About DOI), Published online: 26 July 2009

Table of Contents - July 2009 - Volume 15, Supplement S2

Physical Sciences

Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM

L-Y Chang^a1, S Lazar^a2, EA Baranova^a3, C Bock^a3 and GA Botton^a1

^a1McMaster University,Canada

^a2FEI Company,Netherlands

^a3National Research Council,Canada

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009