Probability in the Engineering and Informational Sciences
- Probability in the Engineering and Informational Sciences / Volume 7 / Issue 01 / January 1993, pp 121-124
- Copyright © Cambridge University Press 1993
- DOI: http://dx.doi.org/10.1017/S0269964800002813 (About DOI), Published online: 27 July 2009
Research Article
An Improved Lower Bound on the Minimum Expected Number of Binomial Group Tests
Julia Abrahamsa1
a1 Mathematical Sciences Division, Office of Naval Research, Arlington, Virginia 22217-5660
Abstract
The minimum expected number of binomial group tests is lower bounded by the cost of a particular Huffman coding problem whose solution is known. Thus, the information lower bound in binomial group testing is improved when the probability that each item is defective is small.
