Journal of the International Neuropsychological Society



Test–retest reliability and practice effects of Expanded Halstead–Reitan Neuropsychological Test Battery


SUREYYA S.  DIKMEN a1a2a3c1, ROBERT K.  HEATON a5, IGOR  GRANT a5a6 and NANCY R.  TEMKIN a2a4
a1 Department of Rehabilitation Medicine, University of Washington, Seattle, WA
a2 Department of Neurological Surgery, University of Washington, Seattle, WA
a3 Department of Psychiatry and Behavioral Sciences, University of Washington, Seattle, WA
a4 Department of Biostatistics, University of Washington, Seattle, WA
a5 Departments of Psychiatry, University of California, San Diego, La Jolla, CA
a6 VA San Diego Healthcare System, San Diego, CA

Abstract

Test–retest reliabilities and practice effects of a broad range of neuropsychological measures were examined in 384 normal or neurologically stable adults. Median test–retest interval was 11 months (range 3–16 months). The reliability estimates for most of the measures are reasonably good, ranging from .70 to low .90s. An exception is the relatively poor reliabilities of most memory measures. For all test measures, the value on initial testing is a strong determinant of the value on the second examination. Practice effects are seen on most measures. The magnitude of the practice effects, however, varies as a function of type of measure, test–retest interval, age, and overall competency level of the participant. This study provides several types of retest information that may be useful for future research and clinical work: comparative reliabilities of the various measures, estimate of error variability associated with each administration, standard deviation of the change, and comparative magnitude of practice effects on various tests. (JINS, 1999, 5, 346–356.)

(Received October 13 1997)
(Revised June 18 1998)
(Accepted July 13 1998)


Key Words: Test–retest reliability; Practice effects; Neuropsychological tests.

Correspondence:
c1 Reprint requests to: Sureyya Dikmen, Department of Rehabilitation Medicine (Box 356490), University of Washington, Seattle, WA 98195-6490. E-mail: dikmen@u.washington.edu


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