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A Novel Automated Approach to Serial Block Face DualBeam Electron Microscopy for the Exploration of Cortical Circuits

Published online by Cambridge University Press:  31 July 2006

GW Knott ,
DC Wall ,
H Mulders ,
DB Chklovskii ,
S Reyntjens  and
BH Lich
GW Knott
Affiliation:
University of Lausanne
DC Wall
Affiliation:
FEI Company
H Mulders
Affiliation:
FEI Company
DB Chklovskii
Affiliation:
Cold Spring Harbor Labs
S Reyntjens
Affiliation:
FEI Company
BH Lich
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1236 - 1237
Copyright
© 2006 Microscopy Society of America