Microscopy and Microanalysis

Invited Paper

Advances in Instrumentation and Techniques - TEM Automation

Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

KJ Hayworth a1, Kasthuri a2, Schalek a2 and JW Lichtman a2
a1 University of Southern California
a2 Harvard University

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005