Microscopy and Microanalysis



Abstract


Physical Sciences - Multi-length Scale Characterization of Materials from Nanometer to Millimeter

A Study of Dewetting on (001) Rutile using AFM


JL Riesterer a1, SR Gilliss a1, Ravishankar a2 and CB Carter a1
a1 University of Minnesota
a2 Indian Institute of Science

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005