Microscopy and Microanalysis



Abstract


Physical Sciences - Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Studying Trapped Grains in Alumina using SEM and EBSD


JL Riesterer a1, JK Farrer a2, Ravishankar a3 and CB Carter a1
a1 University of Minnesota
a2 Brigham Young Universty
a3 Indian Institute of Science

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006