Microscopy and Microanalysis


Advances in Instrumentation and Techniques - FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Gallium Phase Formation in Cu During 30kV Ga+ FIB Milling

JR Michael a1
a1 Sandia National Laboratories

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006