Microscopy and Microanalysis

Table of Contents - 2006 - Volume 12, Issue 01  


MICROANALYSIS

Misorientation Mapping for Visualization of Plastic Deformation via Electron Back-Scattered Diffraction

L.N.  Brewer  a1 c1 p1 , M.A.  Othon  a1 , L.M.  Young  a1 and T.M.  Angeliu  a1
a1 General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA

Article author query
brewer ln   [PubMed][Google Scholar] 
othon ma   [PubMed][Google Scholar] 
young lm   [PubMed][Google Scholar] 
angeliu tm   [PubMed][Google Scholar] 

Abstract

The ability to map plastic deformation around high strain gradient microstructural features is central in studying phenomena such as fatigue and stress corrosion cracking. A method for the visualization of plastic deformation in electron back-scattered diffraction (EBSD) data has been developed and is described in this article. This technique is based on mapping the intragrain misorientation in polycrystalline metals. The algorithm maps the scalar misorientation between a local minimum misorientation reference pixel and every other pixel within an individual grain. A map around the corner of a Vickers indentation in 304 stainless steel was used as a test case. Several algorithms for EBSD mapping were then applied to the deformation distributions around air fatigue and stress corrosion cracks in 304 stainless steel. Using this technique, clear visualization of a deformation zone around high strain gradient microstructural features (crack tips, indentations, etc.) is possible with standard EBSD data.

(Received April 14 2005)
(Accepted August 31 2005)


Key Words: EBSD; plasticity; fracture; electron diffraction; misorientation.

Correspondence:
c1 Corresponding author. E-mail: lnbrewe@sandia.gov
p1 L.N. Brewer is now at Sandia National Laboratories, Albuquerque, New Mexico