Microscopy and Microanalysis

Special Issue: Frontiers of Electron Microscopy in Materials Science

Structure Determination of Atomically Controlled Crystal Architectures Grown within Single Wall Carbon Nanotubes

Angus I.  Kirkland  a1 c1 , Rüdiger R.  Meyer  a1 , J.  Sloan  a2 and J.L.  Hutchison  a1
a1 University of Oxford, Department of Materials, Parks Road, Oxford OX1 3PH, UK
a2 Inorganic Chemistry Laboratory, South Parks Road, Oxford OX1 3QR, UK

Article author query
kirkland ai   [PubMed][Google Scholar] 
meyer rr   [PubMed][Google Scholar] 
sloan j   [PubMed][Google Scholar] 
hutchison jl   [PubMed][Google Scholar] 


Indirect high resolution electron microscopy using one of several possible data-set geometries offers advantages over conventional high-resolution imaging in enabling the recovery of the complex wavefunction at the specimen exit plane and simultaneously eliminating the aberrations present in the objective lens. This article discusses results obtained using this method from structures formed by inorganic materials confined within the bores of carbon nanotubes. Such materials are shown to be atomically regulated due to their confinement, leading to integral layer architectures that we have termed “Feynman crystals.” These one-dimensional (1D) crystals also show a wide range of structural deviations from the bulk, including unexpected lattice distortions, and in some cases entirely new forms have been observed.

(Received March 3 2004)
(Accepted May 26 2004)

Key Words: high resolution electron microscopy; image reconstruction; aberration measurement.

c1 Corresponding author. E-mail: angus.kirkland@materials.ox.ac.uk