Microscopy and Microanalysis

Table of Contents - 2005 - Volume 11, Supplement S02  


Invited Paper


Physical Sciences Symposia - Advances in In-situ Electron Microsocpy Technique and Applications

Orientation Mapping in Polycrystalline Ice Using Electron Backscatter Patterns

D Iliescu a1, I Baker a1 and C P Daghlian a1
a1 Dartmouth College

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005